Bit Error Rate and Channel Capacity Performance of Telemetry Modulation Methods Under Typical Reentry Plasma Sheath Channel
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Title of Paper:Bit Error Rate and Channel Capacity Performance of Telemetry Modulation Methods Under Typical Reentry Plasma Sheath Channel
Journal:IEEE TRANSACTIONS ON PLASMA SCIENCE
All the Authors:姚博
Document Type:J
Volume:47
Issue:11
Page Number:4950-4960
Translation or Not:No
Date of Publication:2019-12-10
Date:2025-04-23